Garment pattern optimized identification based on non-uniform B-spline wavelet and its application

With the peculiarities of garment pattern shape and structure in mind, the authors proposed a method for non-uniform B-spline curve fitting in which the distribution of data points was determined by curvature. The spline wavelet was used to compress and optimize the data points so as to make its number as small as possible under the permissible error margin. Being robust, the method provided an intellective and efficacious input technology for pattern design in garment computer aided design (CAD).